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| Auger
Instrument |
| JEOL
model JAMP-7830F Field Emission Microprobe fully automated
digital scanning
Auger microprobe featuring a hemispherical analyzer (HSA) with multiple
channel detectors, and a thermal field emission gun (TFEG).
The TFEG provides
the highest spatial resolution available for Auger spot analysis, Auger
mapping and secondary electron imaging. TFEG optical system
performs at
0.5 to 25kV with 5nm SEI resolution and 15nm Auger resolution. HSA offers
both high-energy resolution for spectroscopy studies and high
sensitivity
mode for trace delectability. The HSA, capable of electrically controlling
its energy resolution from 0.05% to 0.5%, enables chemical
state analysis
at high-energy resolution as well as high sensitivity composition analysis
and REELS. The ability to measure chemical state differences
results from
the high-energy resolution, which enables the measurement of the differences
of chemical shifts for compounds versus pure elements. In
addition this
instrument is equipped with a heating stage, allowing specimen temperatures
to be increased from room temperature to 800°C, and a UHV
specimen cooling and fracture device for in-situ fracture
analysis. This instrument is also
equipped with energy dispersive spectroscopy (EDS), backscatter electron
detector (BED) and residual gas analyzer (RGA). The addition
of a fully
automated stage and a user friendly workstation-based automation system
make the JAMP-7830F a uniquely simple instrument to operate.
All data are
stored in both ISO data file and TIFF image formats for convenient transfer
and further processing. |
| bullits |
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